The main purpose of Avantgarde Compact Room Temperature Manual Probe Stations is to provide a test platform for the electrical parameter testing of semiconductor chips, with different external measuring instruments, which can be used to complete the testing of integrated circuits, such as voltage, current, resistance, and capacitance-voltage characteristic curves, etc., and are used for non-destructive testing of ultra-small chip wafers and devices at room temperature.

SPSM series compact room temperature manual probe table is an affordable, entry-level probe table, capable of 2-inch, 4-inch wafers for a large number of non-destructive, standard electrical experiments, external different test equipment, you can complete the electrical characteristics of the device measurements, parameter measurements, DC measurements. The compact desktop design is the best choice for academic and experimental research.

Features
- The sample holder can hold samples up to 4-inch wafers.
- Displacement mounts underneath the sample holders allow for fine 3D displacement of the sample holders for easy sample testing and sample changeover.
- Up to 6 probe arms can be mounted
- The probe arms are magnetized and can be moved arbitrarily, and can be fine-tuned in three dimensions for easy operation and precise pinning, and the probes of the four probe arms can be pinned to any position of the sample.
- The probe arm adopts three coaxial cables and three coaxial connectors, the leakage current is small, within 100fA.
- The maximum magnification of CCD is 180 times, and the maximum working distance is 100mm.