There are a total of 8 Products

• Closed Circuit Cryogenic Probe Stations PSM-65K Series

  Cryogenic Probe Stations play a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples in a low-temperature environment, which helps researchers gain an in-depth understanding of the various physical and electrical properties of materials or devices, thus providing important data support for the research, development and application of new materials.

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• Closed Circuit Cryogenic Probe Stations PSM-4K Series

  PSM-4K series cryogenic probe station is a closed-cycle cryogenic probe station with excellent performance. Its compact and low vibration design can provide a <5K-350K high and low temperature vacuum testing environment for electrical parameter testing of semiconductor chips. By connecting with different electrical measuring instruments, it can complete the testing of materials/devices with parameters such as IV, CV, optics, and microwave, etc., and realize the non-destructive electrical testing of chips, wafers, and devices under the low-temperature vacuum environment.

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• Room Temperature Solenoid Probe Station PSEM Series

  PSEM Series Room Temperature Electromagnet Probe Stage is a probe stage specially developed for room temperature variable magnetic field electrical test environment, providing ±0.6T vertical magnetic field or ±0.3T horizontal magnetic field, capable of 2" and 4" wafers for repetitive, standard electrical experiments, external different test equipment can be completed on the device's electrical characteristics, parametric measurements, DC measurements, RF measurements and Hall measurements.

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• Room Temperature Permanent Magnet Probe Station PSPM Series

  PSPM Series Room Temperature Permanent Magnet Probe Stage is a probe stage specially developed for room temperature vertical magnetic field electrical measurement environment, providing 0.5T vertical magnetic field, capable of performing repetitive and standard electrical experiments on 2-inch, 4-inch, 6-inch, and 8-inch wafers, and the external connection of different test equipments can be used to complete the electrical characterization, parametric measurements, DC measurements, RF measurements, and Hall measurements of the devices.

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• Compact Manual Probe Stations SPSM Series

  The main parameters of SPSM series probe stage are sample holder size: 2 inches, 4 inches; maximum number of probe arms 6; sample environment in the atmosphere, temperature range: room temperature.SPSM series compact room temperature manual probe stage is an affordable, entry-level probe stage, capable of 2-inch, 4-inch wafers to carry out a large number of non-destructive, standard electrical experiments, the external connection to the different test equipment, you can complete the Electrical characterization, parameter measurement, DC measurement of the device. The compact desktop design is the best choice for academic and experimental research.

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• Liquid Nitrogen Probe Station PSM-LN2 Series

  The PSM-LN2 liquid nitrogen high and low temperature vacuum probe station can provide an high and low temperature(80K-800K) vacuum testing environment for the electrical parameter testing of semiconductor chips. By connecting different electrical measurement instruments, it can complete the detection of voltage, current, resistance, and IV curve parameters of integrated circuits, used for non-destructive electrical testing of chips, wafers, and devices in low temperature vacuum environments.

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• Standard Room Temperature Manual Probe Stations PSM Series

  PSM series room temperature manual probe table is a high-quality probe table is able to carry out a large number of non-destructive, standard electrical experiments on 2-inch, 4-inch, 6-inch and 8-inch wafers, and the external connection of different test equipments can complete the measurement of electrical characteristics of the device, parameter measurement and DC measurement. The scientific desktop design is the best choice for academic and experimental research.

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• Room Temperature Vacuum Probe Stations PSV Series

  PSV series room-temperature vacuum probe stage is a probe stage specially developed for room-temperature vacuum electrical test environment, capable of repeating non-destructive, standard electrical experiments on 2-inch and 4-inch wafers, and external different test equipment can be used to complete electrical characterization, parametric measurements, DC measurements, and RF measurements on the devices.

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